![]() The characteristic bending pattern is most pronounced when a wave from a coherent source (such as a laser) encounters a slit/aperture that is comparable in size to its wavelength, as shown in the inserted image. In classical physics, the diffraction phenomenon is described by the Huygens–Fresnel principle that treats each point in a propagating wavefront as a collection of individual spherical wavelets. ![]() Infinitely many points (three shown) along length d on the registering plate. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. It is mathematically easier to consider the case of far-field or Fraunhofer diffraction, where the point of observation is far from that of the diffracting obstruction, and as a result, involves less complex mathematics than the more general case of near-field or Fresnel diffraction.Not to be confused with refraction, the change in direction of a wave passing from one medium to another.Ī diffraction pattern of a red laser beam projected onto a plate after passing through a small circular aperture in another plateĭiffraction is the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The problem of calculating what a diffracted wave looks like, is the problem of determining the phase of each of the simple sources on the incoming wave front. The fourth figure, for example, shows a comparison of a double-slit pattern with a pattern formed by five slits, both sets of slits having the same spacing between the center of one slit and the next. When the diffracting object has a periodic structure, for example in a diffraction grating, the features generally become sharper.The diffraction angles are invariant under scaling that is, they depend only on the ratio of the wavelength to the size of the diffracting object.(More precisely, this is true of the sines of the angles.) In other words: the smaller the diffracting object, the wider the resulting diffraction pattern, and vice versa. The angular spacing of the features in the diffraction pattern is inversely proportional to the dimensions of the object causing the diffraction.Several qualitative observations can be made of diffraction in general: In the case of light shining through small circular holes we will have to take into account the full three-dimensional nature of the problem. For light, we can often neglect one dimension if the diffracting object extends in that direction over a distance far greater than the wavelength. For water waves, this is already the case, as water waves propagate only on the surface of the water. The simplest descriptions of diffraction are those in which the situation can be reduced to a two-dimensional problem. Usually, it is sufficient to determine these minima and maxima to explain the observed diffraction effects. If the distance to each source is an integer plus one half of a wavelength, there will be complete destructive interference. If the distance to each of the simple sources differs by an integer number of wavelengths, all the wavelets will be in phase, resulting in constructive interference. That is, at each point in space we must determine the distance to each of the simple sources on the incoming wavefront. Thus in order to determine the pattern produced by diffraction, the phase and the amplitude of each of the wavelets is calculated. Numerical approximations may be used, including the Fresnel and Fraunhofer approximations.ĭiffraction of a scalar wave passing through a 1-wavelength-wide slit Diffraction of a scalar wave passing through a 4-wavelength-wide slit General diffraction īecause diffraction is the result of addition of all waves (of given wavelength) along all unobstructed paths, the usual procedure is to consider the contribution of an infinitesimally small neighborhood around a certain path (this contribution is usually called a wavelet) and then integrate over all paths (= add all wavelets) from the source to the detector (or given point on a screen). ![]() Such treatments are applied to a wave passing through one or more slits whose width is specified as a proportion of the wavelength. For broader coverage of this topic, see Diffraction.ĭiffraction processes affecting waves are amenable to quantitative description and analysis. ![]()
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